Student
|
Employer
|
Dissertations
|
Jesse Johnson
|
Mainstream Engineering Inc. |
|
Barbara Kazanowska
|
Applied Materials |
Chemical Wet Etching of Al(X)Ga(1-X)N Nanostructures
|
Emily Turner
|
|
Investigation of Si Quantum Dot Formation via High-Temperature Oxidation of Si/SiGe Nanostructures
|
Gibson Scisco
|
University of Maryland |
Templated Carbon Nanotube Electrodes for On-Chip Electrochemical Double Layers Capacitors
|
Katherine Haynes
|
Lam Research
|
Defect Evolution During Elevated-Temperature Helium Implantation Into Silicon
|
David Brown
|
Air Force Research Lab
|
Phase Properties of Semiconductor and Transition Metal Materials from Experimental and Computational Principles
|
Zach Weinrich
|
Intel
|
Dopant-Defect Interactions In Epitaxially Grown Highly Doped Si:P
|
Will Brewer
|
Micron
|
Investigation Of Si/SiGe FinFETS And Vertically Stacked Nanowires Via Atom Probe Tomography
|
Caleb Barrett
|
Intel
|
Investigation of Antiphase Domain Boundary Energetics in GaAs-ON-Si(001)
|
Ethan Kennon
|
Keysight Tech.
|
Behavior of Highly Te doped InGaAs
|
Ryan Murray
|
IMEC San Francisco
|
The Effect of Ion Implantation on the Structural and Electronic Properties of Molybdenum Disulfide
|
Tom Martin
|
University of Wyoming
|
Effects of Ultra-Thin Germanium Layers at the Silicon-Oxide Interface During Oxidation Reactions on Injection of Interstitials
|
Henry Aldridge
|
Global Foundries
|
Continuum Modelling of Silicon Diffusion In Indium Gallium Arsenide
|
Aaron Lind
|
Intel
|
“Dopant-Defect Interactions in Si Doped InGaAs”
|
Nick Vito
|
FEI
|
“Studies on the Role of the Substrate Interface for Germanium and Silicon Lithium Ion Battery Anodes”
|
Brad Yates
|
Intel
|
“Implantation and activation of ultra-shallow boron in germanium”
|
Blake Darby
|
Intel
|
“Amorphization and solid phase epitaxial growth of germanium”
|
Sidan Jin
|
Intel
|
“Boron activation and diffusion in polycrystalline silicon with flash-assist rapid thermal annealing”
|
Daniel Gostovic
|
HP
|
“A multi-length scale approach to correlating solid oxide fuel cell porous cathode microstructure to electrochemical performance”
|
Nicholas G. Rudawski
|
Univ. of Florida
|
“Stressed solid-phase epitaxial growth of silicon”
|
J. Samuel Moore
|
Intel
|
“Influence of germanium concentration and homogeneous boron doping on microstructure, kinetics, and sheet resistance of nickelgermanosilicide thin films”
|
Michelle Phen
|
Intel
|
“Strain relaxation and solid phase epitaxial regrowth in ion implanted strained silicon and strained silicon germanium”
|
Aijie Chen
|
Case Western University
|
“Effect of cathode microstructure on cathode polarization in sintered strontium-doped lanthanum manganite/yttria stabilized zirconia solid oxide fuel cells”
|
Diane Hickey
|
Advanced Diamond Technologies
|
“Ion implantation induced defect formation and amorphization in the group IV semiconductors: diamond, silicon and germanium”
|
Renata Camillo-Castillo
|
IBM
|
“Boron activation and diffusion in silicon for varying initial process conditions during flash-assist rapid thermal annealing”
|
Jeanette Jacques
|
DRS Technologies
|
“Boron diffusion within amorphous silicon materials”
|
Robert Crosby
|
Intel
|
“Evolution of self-interstitials induced by ion-implantation in SiGe alloys”
|
Antonio Saavedra
|
Intel
|
“Interfacial phenomena in ion implanted silicon-on-insulator materials”
|
Robert R. Robison
|
Intel
|
“Simulation of fluorine diffusion behavior and boron-fluorineco-interaction in silicon”
|
Kevin Gable
|
DRS Technologies
|
“Boron activation and diffusion during millisecond annealing of ion-implanted silicon”
|
Mark Clark
|
Twincreeks
|
“Laser thermal processing of novel doping schemes in silicon”
|
Erik Kuryliw
|
Intel
|
“Analyzing the thermal annealing behavior of laser thermal processed silicon”
|
Chad Lindfors
|
Intel
|
“Low temperature solid phase epitaxial regrowth of ion implanted boron in silicon”
|
Aaron Lilak
|
Intel
|
“Analysis and modeling of transient phenomena in boron-doped silicon”
|
Lance Robertson
|
DRS Technologies
|
“Diffusion of ion implanted boron in silicon: the effects of lattice defects and co-implanted impurities”
|
Richard Brindos
|
Intel
|
“Determination and modeling of the interaction between arsenic and silicon interstitials in silicon”
|
Patrick Keys
|
Intel
|
“Phosphorus-defect interactions during thermal annealing of ion implanted silicon”
|
Gopalakrishnan Subramanian
|
|
“Atomistic simulation studies of defect formation, migration and stability in ion-implanted silicon”
|
Qing Zhai
|
Varian Semiconductor
|
“Effects of co-dopants on the microstructure and electroluminescence of ZnS:Mn thin film phosphors”
|
Sushil Bharatan
|
Analog Devices
|
“Extraction of point defect parameters by quantitative transmission electron microscopy”
|
Sharon Cobb
|
NASA
|
“Microstructural development during the directional solidification of mercury zinc selenide alloys”
|
Ranju Datta
|
|
“The effect of implantation conditions on microstructural evolution in oxygen implanted silicon”
|
Ananth Naman
|
Cabot Corporation
|
“Characterization of the phosphor layer microstructure and its effects on the electroluminescent properties of thin-film electroluminescent devices”
|
Scott B. Herner
|
Twincreeks
|
“Point defects in silicon with a titanium disilicide film and vacancy/extrinsic dislocation loop interaction”
|
Jinning Liu
|
IBM
|
“Defect and diffusion study in boron implanted silicon”
|
Jong Ryul Kim
|
|
“Study of electrical degradation of II-VI ZnSe-based single quantum-well light-emitting devices”
|
Christopher J. Santana
|
RF Microdevices
|
“Nucleation and growth of AlGaP on silicon by metal-organic molecular beam epitaxy”
|
Jengyi Yu
|
Novellus Systems
|
“Low-pressure metalorganic chemical vapor deposition of thin zinc sulfide phosphor layers with modulation doping for thin film electroluminescent devices”
|
David Venables
|
|
“Defect formation and evolution in high dose oxygen implanted silicon”
|