Student
|
Employer
|
Dissertations
|
| Lydia Kuebler |
Applied Materials |
TEM Investigation of Al+-Implanted 4H-SIC Substrates after high temperature annealing |
| Chappel Sharrock |
Intel |
Novel Diffusion Mechanisms during the Oxidation of Silicon Germanium/Silicon Heterostructures |
| Jesse Johnson |
Mainstream Engineering Inc. |
Pulsed Laser Melting of Epitaxial SiGe and Synthesis of Titanium-Germanosilicide Contact Liners |
| Barbara Kazanowska |
Applied Materials |
Chemical Wet Etching of Al(X)Ga(1-X)N Nanostructures |
| Emily Turner |
|
Investigation of Si Quantum Dot Formation via High-Temperature Oxidation of Si/SiGe Nanostructures |
| Gibson Scisco |
University of Maryland |
Templated Carbon Nanotube Electrodes for On-Chip Electrochemical Double Layers Capacitors |
| Katherine Haynes |
Lam Research |
Defect Evolution During Elevated-Temperature Helium Implantation Into Silicon |
| David Brown |
Air Force Research Lab |
Phase Properties of Semiconductor and Transition Metal Materials from Experimental and Computational Principles |
| Zach Weinrich |
Intel |
Dopant-Defect Interactions In Epitaxially Grown Highly Doped Si:P |
| Will Brewer |
Micron |
Investigation Of Si/SiGe FinFETS And Vertically Stacked Nanowires Via Atom Probe Tomography |
| Caleb Barrett |
Intel |
Investigation of Antiphase Domain Boundary Energetics in GaAs-ON-Si(001) |
| Ethan Kennon |
Keysight Tech. |
Behavior of Highly Te doped InGaAs |
| Ryan Murray |
IMEC San Francisco |
The Effect of Ion Implantation on the Structural and Electronic Properties of Molybdenum Disulfide |
| Tom Martin |
University of Wyoming |
Effects of Ultra-Thin Germanium Layers at the Silicon-Oxide Interface During Oxidation Reactions on Injection of Interstitials |
| Henry Aldridge |
Global Foundries |
Continuum Modelling of Silicon Diffusion In Indium Gallium Arsenide |
| Aaron Lind |
Intel |
“Dopant-Defect Interactions in Si Doped InGaAs” |
| Nick Vito |
FEI |
“Studies on the Role of the Substrate Interface for Germanium and Silicon Lithium Ion Battery Anodes” |
| Brad Yates |
Intel |
“Implantation and activation of ultra-shallow boron in germanium” |
| Blake Darby |
Intel |
“Amorphization and solid phase epitaxial growth of germanium” |
| Sidan Jin |
Intel |
“Boron activation and diffusion in polycrystalline silicon with flash-assist rapid thermal annealing” |
| Daniel Gostovic |
HP |
“A multi-length scale approach to correlating solid oxide fuel cell porous cathode microstructure to electrochemical performance” |
| Nicholas G. Rudawski |
Univ. of Florida |
“Stressed solid-phase epitaxial growth of silicon” |
| J. Samuel Moore |
Intel |
“Influence of germanium concentration and homogeneous boron doping on microstructure, kinetics, and sheet resistance of nickelgermanosilicide thin films” |
| Michelle Phen |
Intel |
“Strain relaxation and solid phase epitaxial regrowth in ion implanted strained silicon and strained silicon germanium” |
| Aijie Chen |
Case Western University |
“Effect of cathode microstructure on cathode polarization in sintered strontium-doped lanthanum manganite/yttria stabilized zirconia solid oxide fuel cells” |
| Diane Hickey |
Advanced Diamond Technologies |
“Ion implantation induced defect formation and amorphization in the group IV semiconductors: diamond, silicon and germanium” |
| Renata Camillo-Castillo |
IBM |
“Boron activation and diffusion in silicon for varying initial process conditions during flash-assist rapid thermal annealing” |
| Jeanette Jacques |
DRS Technologies |
“Boron diffusion within amorphous silicon materials” |
| Robert Crosby |
Intel |
“Evolution of self-interstitials induced by ion-implantation in SiGe alloys” |
| Antonio Saavedra |
Intel |
“Interfacial phenomena in ion implanted silicon-on-insulator materials” |
| Robert R. Robison |
Intel |
“Simulation of fluorine diffusion behavior and boron-fluorineco-interaction in silicon” |
| Kevin Gable |
DRS Technologies |
“Boron activation and diffusion during millisecond annealing of ion-implanted silicon” |
| Mark Clark |
Twincreeks |
“Laser thermal processing of novel doping schemes in silicon” |
| Erik Kuryliw |
Intel |
“Analyzing the thermal annealing behavior of laser thermal processed silicon” |
| Chad Lindfors |
Intel |
“Low temperature solid phase epitaxial regrowth of ion implanted boron in silicon” |
| Aaron Lilak |
Intel |
“Analysis and modeling of transient phenomena in boron-doped silicon” |
| Lance Robertson |
DRS Technologies |
“Diffusion of ion implanted boron in silicon: the effects of lattice defects and co-implanted impurities” |
| Richard Brindos |
Intel |
“Determination and modeling of the interaction between arsenic and silicon interstitials in silicon” |
| Patrick Keys |
Intel |
“Phosphorus-defect interactions during thermal annealing of ion implanted silicon” |
| Gopalakrishnan Subramanian |
|
“Atomistic simulation studies of defect formation, migration and stability in ion-implanted silicon” |
| Qing Zhai |
Varian Semiconductor |
“Effects of co-dopants on the microstructure and electroluminescence of ZnS:Mn thin film phosphors” |
| Sushil Bharatan |
Analog Devices |
“Extraction of point defect parameters by quantitative transmission electron microscopy” |
| Sharon Cobb |
NASA |
“Microstructural development during the directional solidification of mercury zinc selenide alloys” |
| Ranju Datta |
|
“The effect of implantation conditions on microstructural evolution in oxygen implanted silicon” |
| Ananth Naman |
Cabot Corporation |
“Characterization of the phosphor layer microstructure and its effects on the electroluminescent properties of thin-film electroluminescent devices” |
| Scott B. Herner |
Twincreeks |
“Point defects in silicon with a titanium disilicide film and vacancy/extrinsic dislocation loop interaction” |
| Jinning Liu |
IBM |
“Defect and diffusion study in boron implanted silicon” |
| Jong Ryul Kim |
|
“Study of electrical degradation of II-VI ZnSe-based single quantum-well light-emitting devices” |
| Christopher J. Santana |
RF Microdevices |
“Nucleation and growth of AlGaP on silicon by metal-organic molecular beam epitaxy” |
| Jengyi Yu |
Novellus Systems |
“Low-pressure metalorganic chemical vapor deposition of thin zinc sulfide phosphor layers with modulation doping for thin film electroluminescent devices” |
| David Venables |
|
“Defect formation and evolution in high dose oxygen implanted silicon” |