G.E. Davis, S. Prussin and K.S. Jones, “Nitrogen Contamination in SIMOX Wafers,” in “Silicon-on-Insulator and Buried Metals in Semiconductors,” Mat. Res. Soc. Symp. Proc., 107, 111-116, 1987.
K.S. Jones, S. Prussin and D. Venables, “The Effect of Implant Species on the Stability of Ion Implantation Damage,” Mat. Res. Soc. Symp. Proc., 100, 277-282, 1987.