M. S. Phen, K. S. Jones, and V. Craciun, “Strain relaxation and solid phase eptiaxial regrowth in ion-implanted strained silicon on relaxed SiGe,” Materials Research Society Spring Meeting (2006).

J. S. Moore, K. S. Jones, and K. Thompson, “Developing local electrode atom probe as a method of characterizing semiconductors,” Materials Research Society Spring Meeting (2006).

D. Zeenberg and K. S. Jones, “Varying the regrowth conditions of amorphous silicon with laser spike annealing,” Materials Research Society Spring Meeting (2006).

N. G. Rudawski, K. N. Siebein, K. S. Jones, and J. Liu, “Effect of uniaxial stress on solid phase epitaxial regrowth and mask edge defect formation in two-dimensional amorphized Si,” Materials Research Society Spring 2006 Meeting (2006).

L. A. Edelman, J. M. Jacques, J. L. Hoyt, R. G. Gilliman, and K. S. Jones, “Diffusion of ion implanted dopants in amorphous SiGe during solid phase epitaxial recrystallization,” Materials Research Society Spring Meeting (2006).

J. M. Jacques, K. S. Jones, M. E. Law, L. S. Robertson, L. M. Rubin, and E. Napolitani, “Room temperature boron diffusion in amorphous silicon,” Materials Research Society Spring Meeting (2006).

R. R. Robison and M. E. Law, “Simulation of fluorine diffusion and boron-fluorine cointeraction,” Materials Research Society Spring Meeting (2006).

K. S. Jones, “Ultra shallow dopant activation technologies,” Annual Joint Symposium of the Florida Chapter of the American Vacuum Society Science and Technology Society and the Florida Society for Microscopy (2006).

M. S. Phen, V. Craciun, and K. S. Jones, “Strain relaxation and solid phase epitaxial regrowth in ion-implanted strained silicon on relaxed SiGe,” Annual Joint Symposium of the Florida Chapter of the American Vacuum Society Science and Technology Society and the Florida Society for Microscopy (2006).

D. Gostovic, K. S. Jones, and E. D. Wachsman, “Three-dimensional reconstruction of porous solid oxide fuel cell cathodes,” Annual Joint Symposium of the Florida Chapter of the American Vacuum Society Science and Technology Society and the Florida Society for Microscopy (2006).